Cite the paper
R. Ajay Kumar, R. S. Dubey, V. Ganesan (2017). Reflection Enhancement Using TiO2/SiO2 Bilayer Films Prepared by Cost-Effective Sol-gel Method. Mechanics, Materials Science & Engineering, Vol 10. doi:10.2412/mmse.84.67.762
Authors: R. Ajay Kumar, R. S. Dubey , V. Ganesan
ABSTRACT. Multilayer dielectric thin film structure has been demanded for its application in optoelectronic devices such as optical waveguides, vertical cavity surface-emitting devices, biosensors etc. In this paper, we present the fabrication and characterization of bilayer thin films of TiO2/SiO2 using sol-gel spin coating method. Ellipsometer measurement showed refractive index values 1.46, 2.1 corresponding to the SiO2 and TiO2 films respectively. The FTIR transmittance peaks observed at ~970 cm-1, ~1100 cm-1 and ~1400 cm-1 are attributed to the Ti-O-Si, Si-O-Si and Ti-O-Ti bonds respectively. Maximum reflectance is observed from two bilayer film structure which can be further optimized to get the high reflection to a broad wavelength range.
Keywords: TiO2, SiO2, TiO2/ SiO2, thin films, sol-gel spin coating method, refractive index, reflection
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